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Fire Sci. Eng. > Volume 31(6); 2017 > Article
Fire Science and Engineering 2017;31(6):83-90.
DOI: https://doi.org/10.7731/KIFSE.2017.31.6.083    Published online December 31, 2017.
과전류에 의해 단락된 전선의 결정성장 특성에 관한 연구
박진영, 방선배, 고영호
1한국전기안전공사
2한국전기안전공사
3전북대학교
Study of the Characteristics and Crystal Growth of a shorted Wire by Overcurrent
Park Jin-Young, Bang Sun-Bae, Ko Young-Ho
1Korea Electrical Safety Corporation(KESCO)
2Korea Electrical Safety Corporation(KESCO)
3Chonbuk National University
요약
전선에 정격이상의 과전류가 흐르게 되면 온도가 상승하고 전선피복이 열화되어 단락현상이 발생한다. 과전류의 크기에 따라 전선의 온도 상한치는 변화하며, 각각의 온도 상한치에서 단락이 발생할 때, 단락온도와 전선표면온도간 온도차로 인해 응고과정에서 냉각속도 차이가 발생한다. 이때 용융단면에 형성되는 수지상 조직의 패턴특징이 상이하게 된다. 본 논문에서는 과전류 크기에 따라 변화하는 전선온도의 상한치를 측정하고, 이때 단락을 발생시켜 수지상의 2차 가지 간격(Dendrite Arm Spacing : DAS)을 분석하여 수치를 정량화 하였다. 실험결과, 과전류 크기가 커짐에 따라 전선온도의 상한치는 증가하였으며, 전선온도가 높아질수록 2차 가지 간격이 증가하는 것을 확인하였다.
Abstract
If an overcurrent exceeding the rated value is applied to an electric wire, the temperature of the electric wire increases, and the electric wire covering deteriorates to cause a short circuit. The upper limit temperature of the wire varies according to the magnitude of the overcurrent. When a short circuit occurs at each upper temperature limit, a cooling speed difference occurs during the solidification process due to the temperature difference between the short circuit temperature and the wire surface temperature. At this time, the pattern characteristics of the dendritic structure formed on the molten cross section are different. In this study, the upper temperature limit, which varied according to the overcurrent magnitude, was measured. At the time a short circuit occurred, the second branch spacing (dendrite Arm Spacing : DAS) of the dendrite was analyzed and the numerical value was quantified. The experimental results showed that the upper temperature limit increases with the magnitude of the overcurrent, and that the second branch spacing increases with increasing wire temperature.
Key Words: Overcurrent, Dendrite, Solidification, Copper, Short-Circuit, DAS, Dendrite Arm Sapcing


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